The European Conference on X-Ray Spectrometry (EXRS) is a biennial conference series which started in Copenhagen and Göteborg (1984, 1986) and continued in Vienna, Antwerp, Myconos, Budapest, Lisbon, Bologna, Krakow, Berlin, Alghero, Paris, Dubrovnik and Figueira da Foz.
The 14th EXRS conference is devoted to the exchange of information and experience on the emerging and innovative techniques in the field of X-ray spectrometry and related areas. The conference will provide a framework in which scientists of various research areas will be able to convene and discuss X-ray techniques and their successful applications. A rich scientific and social program will allow experienced experts, young scientists, and industrial exhibitors to exchange views and start new collaborative projects.
In 2012, the European Conference on X-Ray Spectrometry will take place in Vienna from 18th - 22nd June 2012. Vienna is one of the most popular congress cities in the world. Located in the heart of Europe, it is a cosmopolitan city of great cultural diversity, a city of 9 universities and many unique research centers and seat of many international organisations.
The EXRS2012 conference will be hosted by the IAEA (International Atomic Energy Agency) and held in the IAEA Conference Center in the Vienna International Centre (VIC), a modern Conference Center with superb conference facilities for participants and exhibitors.
In order to gain access to the conference venue, participants and exhibitors will receive a ground pass from the UN Security Office at Gate 1, after a routine security screening. Ground passes will be issued before the Conference and distributed upon presentation of an invitation letter and a valid ID card with photograph. The cards must be worn visibly within the Vienna International Centre. The ground passes are NOT the badge of the Conference!
Persons attending the Conference are strongly advised to avail themselves to the registration facilities, which will be available on Sunday preceding the official opening in order to avoid excessive congestion on Monday, the first day of the Conference.
As in the previous meetings, the main topics will be:
- Interactions of X-rays with matter and fundamental parameters
- X-ray sources, optics and detectors
- Quantification methodology
- TXRF, GIXRF and related techniques
- Microbeam techniques
- Mobile and portable XRF
- Synchrotron XRS
- PIXE and electron induced XRS
- Recent Scientific Developments by XRS Instrumentation Manufacturers
- X-ray imaging and tomography
- High resolution X-ray absorption and emission spectroscopy
- XRS Applications:
- Advanced materials and nanoscience
- Art and Cultural Heritage
- Earth and environment sciences
- Industrial quality and process control
- Life sciences and forensics
The program will consist of invited lectures, oral presentations, poster contributions and will include an exhibition of the manufacturers of equipment applied in the XRS field.
Scientists, engineers and exhibitors are invited to join the conference and share not only the ideas and current results but also their valuable experience, contributing to the enrichment of the international community. Hope to see you in Vienna!
The Organizing Committees